CVE Catalog

CVE-2025-47380

High
Published: Translated: NVD NIST

Summary

Memory corruption while preprocessing IOCTLs in sensors.

Risk Assessment

May lead to system crashes or malfunction of sensors, potentially affecting safety-related functions.

Recommendation

Update firmware and apply vendor patches.

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Original NVD description (English source)

Memory corruption while preprocessing IOCTLs in sensors.

Vulnerability data from NVD (NIST) · CISA KEV · EPSS