CVE-2025-47380
HighCVSS 7.8Exploitation Probability (EPSS)
Low risk2th percentile - higher than 2% of all known CVEs
Summary
Memory corruption while preprocessing IOCTLs in sensors.
Risk Assessment
May lead to system crashes or malfunction of sensors, potentially affecting safety-related functions.
Recommendation
Update firmware and apply vendor patches.
Other vulnerabilities in Qualcomm
See all- CVE-2026-25294High
Transient DOS while parsing frame during channel usage.
- CVE-2026-25290High
Memory Corruption when validating large data buffers from external sources using addition to check buffer length.
- CVE-2026-25284High
Information Disclosure when a pointer is reused after being deallocated.
- CVE-2026-25283High
Memory Corruption when copying unverified data from an external source exceeds the allocated buffer size.
- CVE-2026-25282High
Transient DOS when processing unverified data from a neighboring system causes out of bound memory access.
- CVE-2026-25281High
Transient DOS when processing large or numerous request buffers without sufficient memory allocation validation.
- CVE-2026-25280High
Memory corruption when processing escape handling flow with insufficient user buffer sizes.
- CVE-2026-25278High
Memory Corruption when processing I2C transfer requests due to a race condition between memory allocation and data copying.
- CVE-2026-24090High
Cryptographic issue while processing partition table entries allows unauthorized modification of boot flow.
- CVE-2025-47396High
Memory corruption occurs when a secure application is launched on a device with insufficient memory.
Original NVD description (English source)
Memory corruption while preprocessing IOCTLs in sensors.
Vulnerability data from NVD (NIST) · CISA KEV · EPSS