CVE Catalog

CVE-2025-47396

HighCVSS 7.8
Published: Updated: Translated: NVD NIST

Exploitation Probability (EPSS)

Low risk
0.14%

3th percentile - higher than 3% of all known CVEs

Summary

Memory corruption occurs when a secure application is launched on a device with insufficient memory.

Risk Assessment

This can lead to system crashes or unpredictable behavior, potentially affecting device stability and security.

Recommendation

Ensure sufficient memory for secure applications and update firmware.

Other vulnerabilities in Qualcomm

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Original NVD description (English source)

Memory corruption occurs when a secure application is launched on a device with insufficient memory.

Vulnerability data from NVD (NIST) · CISA KEV · EPSS