CVE-2026-25278
HighCVSS 7.8Exploitation Probability (EPSS)
Low risk0th percentile - higher than 0% of all known CVEs
Summary
Memory Corruption when processing I2C transfer requests due to a race condition between memory allocation and data copying.
Risk Assessment
The risk includes potential system crashes or hardware malfunction, leading to data integrity issues.
Recommendation
It is recommended to update the software and implement synchronization in I2C operations.
Other vulnerabilities in Qualcomm
See all- CVE-2025-47396High
Memory corruption occurs when a secure application is launched on a device with insufficient memory.
- CVE-2025-47394High
Memory corruption when copying overlapping buffers during memory operations due to incorrect offset calculations.
- CVE-2025-47393High
Memory corruption while accessing resources in kernel driver.
- CVE-2025-47388High
Memory corruption while passing pages to DSP with an unaligned starting address.
- CVE-2025-47380High
Memory corruption while preprocessing IOCTLs in sensors.
- CVE-2025-47356High
Memory Corruption when multiple threads concurrently access and modify shared resources.
- CVE-2025-47348High
Memory corruption while processing identity credential operations in the trusted application.
- CVE-2025-47346High
Memory corruption while processing a secure logging command in the trusted application.
- CVE-2025-47345High
Cryptographic issue may occur while encrypting license data.
- CVE-2026-25294High
Transient DOS while parsing frame during channel usage.
Original NVD description (English source)
Memory Corruption when processing I2C transfer requests due to a race condition between memory allocation and data copying.
Vulnerability data from NVD (NIST) · CISA KEV · EPSS