CVE Catalog

CVE-2025-59605

HighCVSS 7.8
Published: Updated: Translated: NVD NIST

Exploitation Probability (EPSS)

Low risk
0.08%

0th percentile - higher than 0% of all known CVEs

Summary

Memory corruption occurs when processing device identifier strings that exceed the expected maximum length.

Risk Assessment

The risk involves potential system crashes or code execution by an attacker, which could lead to data integrity compromise.

Recommendation

Update the software to the latest version with string length validation fixes and implement input length restrictions.

Related vulnerabilities

Original NVD description (English source)

Memory Corruption when processing device identifier strings that exceed the expected maximum length.

Vulnerability data from NVD (NIST) · CISA KEV · EPSS